The 78th JSAP Autumn Meeting, 2017

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[6a-C24-1~9] 6.6 Probe Microscopy

Wed. Sep 6, 2017 9:30 AM - 11:45 AM C24 (C24)

Takeshi Fukuma(Kanazawa Univ.)

11:00 AM - 11:15 AM

△ [6a-C24-7] Topographical imaging and charged mapping of charged surfaces using scanning ion conductance microscopy with a theta type pipette

〇Tatsuru Shirasawa1, Yusuke Mizutani2, Tatsuo Ushiki2, Futoshi Iwata1,3 (1.Shizuoka Univ., 2.Niigata Univ., 3.Research Institute of Electronics)

Keywords:Scanning Ion Conductance Microscope, Nanopipette, Charge mapping