[6a-S41-1~11] 【CS.9】7.1 & 7.4 Code-sharing session

[6a-S41-2] Analysis of X-ray induced-changes in the spatial distribution of electrostatic force nearby a Au nanoisland by XANAM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:X-ray, Atomic Force Microscopy, elemental analysis

To investigate elemental and chemical analysis on nano-structures at surfaces/interfaces, we developed X-ray aided noncontact atomic force microscopy (XANAM). Based on the principle, the methodology can be also used for the analysis of force potential nearby the nanostructures. The study reports the changes in the spatial distribution of electrostatic force, induced by X-ray irradiation onto a Au nanoisland on a Si substrate.