The 78th JSAP Autumn Meeting, 2017

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15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[6p-A503-1~12] 15.7 Crystal evaluation, impurities and crystal defects

Wed. Sep 6, 2017 1:45 PM - 5:00 PM A503 (503)

Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Satoko Nakagawa(GWJ)

2:45 PM - 3:00 PM

△ [6p-A503-5] Evaluation of Ga1-xInxN thin films by photothermal deflection spectroscopy

〇Kiyotaka Fukuda1,2, Takeyoshi Onuma2, Liwen Sang1, Tomohiro Yamaguchi2, Tohru Honda2, Masatomo Sumiya1 (1.NIMS, 2.Kogakuin Univ.)

Keywords:Photothermal Deflection Spectroscopy, GaInN, GaN

Ga1-xInxN用に光熱偏向分光法を用いた装置の開発と光熱偏向分光法を用いてGa1-xInxNの測定を行い、構造揺らぎに関する指標の検討について