The 78th JSAP Autumn Meeting, 2017

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15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[6p-A503-1~12] 15.7 Crystal evaluation, impurities and crystal defects

Wed. Sep 6, 2017 1:45 PM - 5:00 PM A503 (503)

Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Satoko Nakagawa(GWJ)

3:30 PM - 3:45 PM

[6p-A503-7] Diffusion model for bulk and surface recombination of free carriers in silicon wafer: II. Carrier density distribution

〇Hiroshi Kaneta1, Hideaki Yonezawa2, Ichiro Omura1 (1.Kyushu Inst. Tech., 2.Dpt. Elec. Eng., Kyushu Inst. Tech.)

Keywords:silicon, bulk lifetime, surface recombination