2017年第78回応用物理学会秋季学術講演会

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13 半導体 » 13.2 探索的材料物性・基礎物性

[7a-C13-1~12] 13.2 探索的材料物性・基礎物性

2017年9月7日(木) 09:00 〜 12:15 C13 (事務室2-2)

末益 崇(筑波大)、原 康祐(山梨大)

11:45 〜 12:00

[7a-C13-11] Photoresponse properties of low B-doped p-BaSi2 on
P+ ion-implanted Si (111)

Emha Bayu Miftahullatif1、Takabe Ryota1、Yachi Suguru1、Toko Kaoru1、Suemasu Takashi1 (1.Univ. of Tsukuba)

キーワード:semiconductor, silicide, solar cell

Semiconducting BaSi2 has an indirect band gap of approximately 1.3 eV, matching the solar spectrum, and has large absorption coefficients, reaching 3.0´104 cm-1 at 1.5 eV [1,2]. We have successfully fabricated n-Si/B-doped p-BaSi2 heterojunction solar cells that achieved a conversion efficiency of 9.9% [3]. In the work mentioned, we used an n-Si(111) substrate with n~1015 cm-3, and a 20-nm-thick B-doped p-BaSi2 layer with hole concentration p = 2.2 × 1018 cm-3 [3]. In order to utilize B-doped p-BaSi2 as an active layer, we need to employ n-Si with higher electron concentration n and low p p-BaSi2, so that the depletion region stretches toward the p-BaSi2 layer. However, the rectifying current density versus voltage (J-V) characteristics degraded as we utilized heavily-doped n-Si substrate due to the defects around steps with 3-4 MLs (~1 nm) in height. They were formed during thermal cleaning due to step bunching, confirmed by TEM (Fig. 1). High impurity concentration near the surface is suspected to be one of the origins of this step bunching. In order to reduce this step bunching by maintaining low impurities at the surface, we implant P+ ions into the Si substrate to the depth of 50 nm to form heavily-doped n+-Si embedding layer. We then formed a low B doped p-BaSi2 layer and measured the external quantum efficiency (EQE) as well as the J-V characteristics.