The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

17 Nanocarbon Technology » 17.2 Graphene

[7a-C16-1~12] 17.2 Graphene

Thu. Sep 7, 2017 9:00 AM - 12:15 PM C16 (Training Room 1)

Mari Ohfuchi(Fujitsu)

11:30 AM - 11:45 AM

[7a-C16-10] Capacitance measurement of h-BN encapsulated bilayer graphene on quartz substrate

Teerayut Uwanno1,2, Takashi Taniguchi3, Kenji Watanabe3, Kosuke Nagashio1,4 (1.Univ. of Tokyo, 2.KMITL, 3.NIMS, 4.PRESTO-JST)

Keywords:bilayer graphene, h-BN

Due to limited top gate area, parasitic capacitance and frequency dependence of top gate capacitance have been major issues in capacitance measurement of h-BN encapsulated bilayer graphene on n+-Si substrate. Using graphite as back gate electrode, the device can be fabricated on quartz substrate. This results in drastic reduction of parasitic capacitance and frequency dependence of top gate capacitance, making the evaluation of band gap of h-BN encapsulated bilayer graphene by quantum capacitance measurement possible.