[7a-C24-1~10] 6.6 Probe Microscopy

[7a-C24-5] The determination of electronegativity of individual atoms
using chemically defined AFM tips

〇Hiroki Miyazaki¹, Jo Onoda¹, Yoshiaki Sugimoto¹ (1.The Univ. of Tokyo)

Keywords:Atomic Force Microscopy

We measured electronegativity of individual atoms, by using two kinds of AFM tips that are terminated by different elements.
First, we made Al coated tip by depositing Al onto Si tip. Then we obtained bond energy curves on Al deposited Si surface. As a result, we proved that this tip could be terminated by either Si atom or Al atom.
Finally, we demonstrated that electronegativity of target atoms can be determined experimentally by using Al coated tip.