The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[7p-A411-1~17] 1.5 Instrumentation, measurement and Metrology

Thu. Sep 7, 2017 1:15 PM - 6:00 PM A411 (411)

Nao Terasaki(AIST), Kazuya Kikunaga(AIST), Hiromasa Tokudome(TOTO)

5:00 PM - 5:30 PM

[7p-A411-16] [INVITED] Analysis of dissimilar joint interfaces and study of adhesion mechanism by electron microscopy

Shin Horiuchi1 (1.AIRL, AIST)

Keywords:adhesion, electron microscopy, interface

The study of the mechanism of adhesion is of great importance in order to evaluate the reliability and durability of the adhesive joints. In order to elucidate the bonding mechanism of metal/plastic joints, we have to consider the structures involved in the interfacial region. The interfacial region contains a variety of structures having different special scales and properties from the bulks, and thus it should have certain volume and thickness. We performed scanning transmission electron microscopy (STEM) imaging with simultaneous EDX and EELS recording for investigating the strongly-bonded interfaces between polyphenylenesulfide (PPS) and Al and between PPS and Cu.