The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.5 Surface Physics, Vacuum

[8a-C14-1~12] 6.5 Surface Physics, Vacuum

6.5と7.6のコードシェアセッションあり

Fri. Sep 8, 2017 9:00 AM - 12:15 PM C14 (office 3-1)

Sakura Takeda(NAIST), Mitsunori Kitta(AIST)

9:15 AM - 9:30 AM

[8a-C14-2] Study of far- and deep-ultraviolet surface plasmon resonance of aluminum depending on refractive index and interaction of molecule

〇(M2)Koji Watari1, Ichiro Tanabe2, Yoshito Tanaka3, Hanulia Taras4, Takeyoshi Goto1, Wataru Inami4, Yoshimasa Kawata4, Yukihiro Ozaki1 (1.Kangaku Univ., 2.Osaka Univ., 3.Tokyo Univ., 4.Sizuoka Univ.)

Keywords:Surface plasmon resonance, Far-ultraviolet region, Sensor

Surface Plasmon Resonance (SPR) sensor has been studied in various fields such as biosensor because of its high sensitivity to surrounding refractive index changes. In this study, a novel far- and deep-ultraviolet (FUV and DUV, 150~300nm) SPR sensor has been developed by using aluminum thin film. The new SPR sensor may have high sensitivity.
In this study, by using our original attenuated total reflectance (ATR) FUV-DUV spectroscopy, we successfully measured SPR characteristic behaviors depending on the refractive index changes by putting various solvents on the aluminum thin film.