The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[8a-S22-1~9] 13.8 Compound and power electron devices and process technology

Fri. Sep 8, 2017 9:00 AM - 11:30 AM S22 (Palace B)

Kenji Shiojima(Univ. of Fukui)

11:15 AM - 11:30 AM

[8a-S22-9] Characterization of Vertical 2DHG Diamond MOSFET with Blocking Layer formed by CVD

〇(B)Masayuki Iwataki1, Nobutaka Oi1, Takuya Kudo1, Tsubasa Muta1, Satoshi Okubo1, Ikuto Tsuyuzaki1, Taisuke Kageura1, Masahumi Inaba1,2, Atsushi Hiraiwa1, Hiroshi Kawarada1,3 (1.Waseda Univ., 2.Nagoya Univ., 3.Zaiken)

Keywords:Diamond, Semiconductor, MOSFET

We evaluate the characteristics of the vertical diamond MOSFET which has a doped nitrogen layer .
We obtained the high current density and on/off ratio in wide temperature range.