2:30 PM - 2:45 PM
[8p-A412-7] Basic research on correlation between embedded convex nanostructure in gate and current-voltage characteristics of MOSFET
Keywords:Nano-artifact metrics, device simulation
Oral presentation
9 Applied Materials Science » 9.3 Nanoelectronics
Fri. Sep 8, 2017 1:00 PM - 4:15 PM A412 (412)
Takahide Oya(Yokohama National Univ.), Seiya Kasai(Hokkaido Univ.)
2:30 PM - 2:45 PM
Keywords:Nano-artifact metrics, device simulation