Activation Barrier Measurement of the Forming Process for an Ag/Ta<sub>2</sub>O<sub>5</sub>/Pt Device

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Fri. Sep 8, 2017 1:30 PM - 3:30 PM PA1 (P)

1:30 PM - 3:30 PM

〇(M1)Naoya Tanahashi¹, Tohru Tsuruoka², Tsuyoshi Hasegawa¹ (1.Waseda Univ., 2.NIMS)

Keywords:ReRAM