The 78th JSAP Autumn Meeting, 2017

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[8p-PA1-1~27] 6.3 Oxide electronics

Fri. Sep 8, 2017 1:30 PM - 3:30 PM PA1 (P)

1:30 PM - 3:30 PM

[8p-PA1-11] Activation Barrier Measurement of the Forming Process for an Ag/Ta2O5/Pt Device

〇(M1)Naoya Tanahashi1, Tohru Tsuruoka2, Tsuyoshi Hasegawa1 (1.Waseda Univ., 2.NIMS)

Keywords:ReRAM