Kazuma Takeda

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 9:00 AM - 12:15 PM 412 (412)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[16a-412-1~10] 13.5 Semiconductor devices and related technologies

6.1と13.3と13.5のコードシェアセッションあり

11:45 AM - 12:00 PM

[16a-412-9] Evaluation of SOI back interface state density by CP method

〇Kazuma Takeda¹, Jiro Ida¹, Takuro Hayashi¹, Ryutaro Hosono¹, Yasuo Arai² (1.Kanazawa inst., 2.High Energy Orga.)