Yuanlin Li

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 9:00 AM - 11:30 AM 419 (419)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[14a-419-1~10] 6.3 Oxide electronics

10:00 AM - 10:15 AM

△ [14a-419-5] Evaluation of multilevel memory characteristics of Ta₂O₅ ReRAM using different top electrode

Reon Katsumura¹, 〇Yuanlin Li¹, Mika Gronroos¹, Atsushi Tsurumaki-Fukuchi¹, Masashi Arita¹, Yasuo Takahashi¹, Hideyuki Andoh², Takashi Morie² (1.Hokkaido Univ., 2.Kyushu Inst. Tech.)