The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

12 Organic Molecules and Bioelectronics » 12.2 Characterization and Materials Physics

[14a-311-1~12] 12.2 Characterization and Materials Physics

6.6と12.2のコードシェアセッションあり

Tue. Mar 14, 2017 9:00 AM - 12:15 PM 311 (311)

Masaki Murata(SONY), Keisuke Tajima(RIKEN)

11:00 AM - 11:15 AM

[14a-311-8] Surface Morphology of Pentacene Film on Si substrate Characterized by In-Situ Grazing-Incidence Small Angle X-ray Scattering (I)

Ichiro Hirosawa1, Takeshi Watanabe1, Koganezawa Tomoyuki1, Noriyuki Yoshimoto2 (1.JASRI, 2.Iwate Univ.)

Keywords:organic semiconductor, surface morphology, X-ray scattering

Effects of film thickness on surface morphology of evapolated pentacene film were studied by Grazing-incidence small angle X-ray scattering (GISAXS). A streaky scattering profile along to surface normal was observed about 0.003 nm-1 of in-plane component of wavenumber, thinner film than 1.0 nm. Another streaky profile appeared around 0.020 nm-1 over 2.5 nm.