1:30 PM - 1:45 PM
▲ [14p-412-2] In-Situ Temperature Measurement of Diamond Devices using NV Centers
Keywords:Temperature Measurement, Diamond Device, NV Center
Oral presentation
6 Thin Films and Surfaces » 6.2 Carbon-based thin films
Tue. Mar 14, 2017 1:15 PM - 6:15 PM 412 (412)
Hiroshi Kawarada(Waseda Univ.), Hitoshi Umezawa(AIST), Mariko Suzuki(Toshiba)
1:30 PM - 1:45 PM
Keywords:Temperature Measurement, Diamond Device, NV Center