[14p-414-1~17] 6.6 Probe Microscopy

[14p-414-15] Interaction between adjacent twin Si₄ atom switches

〇Shiro Yamazaki¹, Keisuke Maeda², Yoshiaki Sugimoto³, Masanori Abe⁴, Pablo Pou⁵, Lucia Rodrigo⁵, Ruben Perez⁵, Pingo Mutombo⁶, Pavel Jelinek⁶, Seizo Morita⁷ (1.Tokyo Inst. of Tech., 2.Osaka Univ., 3.Univ. of Tokyo, 4.Osaka Univ.., 5.UAM, 6.ASCR, 7.ISIR)

Keywords:Scanning Probe Microscopy, Atomic Force Microscopy, Atom Switch

We have succeeded in fabricating Si₄ atomic switch consisting of 4 Si atoms on the Si (111) - 7 × 7 surface and switching by both current of scanning tunneling microscope and force of atomic force microscope at the same time. Furthermore, by examining the adjacent Si₄ atomic switches in detail, we found that the positions approaching each other are the most stable and that the frequency of the switch changes depending on the state of partner switch. Its mean that there is an interaction between adjacent Si₄ atom switches.