Quantitative Measurement of Permittivity in Nanoscaled Region Using ∂C/∂z-SNDM

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Tue. Mar 14, 2017 1:15 PM - 5:45 PM 414 (414)

Yoshiaki Sugimoto(Univ. of Tokyo), Osamu Kubo(Osaka Univ.)

2:00 PM - 2:15 PM

〇Yoshiomi Hiranaga¹, Norimichi Chinone¹, Yasuo Cho¹ (1.RIEC. Tohoku Univ.)

Keywords:permittivity, scanning nonlinear dielectric microscopy, scanning probe microscopy