2017年第64回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

9 応用物性 » 9.3 ナノエレクトロニクス

[14p-E206-1~11] 9.3 ナノエレクトロニクス

2017年3月14日(火) 13:45 〜 16:45 E206 (E206)

西口 克彦(NTT)、内藤 泰久(産総研)

13:45 〜 14:00

[14p-E206-1] Ionic Liquid Gating of Metal Contacts: Effect of Cation Size

李 晨陽1、吉田 健治1、柴田 憲治2、小野 新平3、平川 一彦1 (1.東京大学、2.東北工大、3.電力中央研究所)

キーワード:ionic liquid

Electric-double-layer (EDL) gating with ionic liquids has been attracting considerable interests owing to its tremendous gating power.1 Since the EDL formed at liquid/solid interfaces functions as a huge capacitance and can induce large charge accumulation, it is used for gating not only organic materials, oxides, and semiconductors, but also metal systems.2
In this work, we have used a liquid-gated EDL transistor geometry for gold nanojunctions to control the conductance of metal contacts. The ionic liquid we used was DEME-TFSI. Figure 1(a) shows the VG-dependence of the conductance of a gold junction when G ~ 100G0, where G0 º 2e2/h. The conductance of the gold junction increases with increasing VG from 0V, but the conductance increase saturates for VG > 1 V. Furthermore, hysteresis appears when the gate voltage is swept up and down. Figure 1(b) plots the capacitance of the sample as a function of VG. The curve shows only one peak for the sweep-up but two peaks appear for the sweep-down. This behavior is attributed to a geometrical reason: since the ionic structure of a DEME cation can be viewed as a charged head with a neutral tails (while a TFSI anion is regarded as a single charged bead) (Fig. 1(c)), these neutral beads play the role of latent voids that can cause reorientations of the ions3 and causes different ion arrangement for sweep-up and down. This result gives a new insight when EDL gating is used for atomic scale systems. In the presentation, comparison with another kind of cation will also be presented.