The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[14p-F201-1~14] 15.7 Crystal evaluation, impurities and crystal defects

Tue. Mar 14, 2017 1:45 PM - 5:30 PM F201 (F201)

Koji Sueoka(Okayama Pref. Univ.), Satoshi Nakano(Kyushu Univ.)

2:30 PM - 2:45 PM

[14p-F201-4] Influence of Carrier Concentration on Bulk Lifetime in CZ-Si Crystal

Yoshiji Miyamura1, Hirofumi Harada1, Satoshi Nakano1, Koichi Kakimoto1 (1.Kyushu Univ.)

Keywords:lifetime