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▲ [14p-P10-21] MnGa polycrystalline ultrathin films with perpendicular magnetic anisotropy prepared on thermally-oxidized Si substrate
Keywords:spintronics, perpendicular magnetic anisotropy, Mn-based alloys
Here we investigate the structure and magnetic properties of polycrystalline MnGa films on a CoGa buffer layer prepared on thermally-oxidized Si substrate. The stacking structures of Si / SiO2 substrate / MgO(10) / Cr(40) / CoGa(30) / MnGa(tMnGa=1-30 nm) / Mg(0.4) / MgO(5) / Ta(3) (thickness is in nm) were prepared using a magnetron sputtering. The 2θ-θ profiles of X-ray diffraction show the only (002) peaks of the MnGa films with different thicknesses was occurred, indicating that the (001)-textured MnGa films was crystalized. The saturation magnetization and PMA energy of the 3-nm-thick MnGa film were evaluated to be about 200 emu/cm3 and 3 Merg/cm3, respectively, which measured using vibrating sample magnetometer (VSM).