2017年第64回応用物理学会春季学術講演会

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10 スピントロニクス・マグネティクス » 10 スピントロニクス・マグネティクス(ポスター)

[14p-P10-1~98] 10 スピントロニクス・マグネティクス(ポスター)

2017年3月14日(火) 16:00 〜 18:00 P10 (展示ホールB)

16:00 〜 18:00

[14p-P10-38] The Influence of Different Bit Patterns Exposure on TMR Read Head

〇(M2)Gomasang Ploybussara1,3、Kazuyoshi Ueno1,2、Silapunt Rardchawadee3 (1.Shibaura Univ.、2.SIT Green Innov.、3.KMUTT)

キーワード:Tunneling Magneto-Resistance (TMR), magnetic stray field, perpendicular magnetic recording

An increase in the areal density of the hard disk drive (HDD) has been a key to drive HDD technology development. For instance, since a magnetic bit becomes smaller; therefore, a read head dimension must be reduced and advanced fabrication technology is required. However, higher areal density may deteriorate magnetic reading performance due to magnetic interference between bits. For these reasons, the investigation of abnormal characteristic of read head is necessary to understand read head behavior, in order to improve the overall HDD performance.
From the measurement of Tunneling Magneto Resistance (TMR) read head's resistance during read process, we found the abnormal resistance change while the head was on the transition region.
The relations among bit patterns formation, read sensor resistance, and variation of magnetization’s angle in free layer (FL) are determined. These findings will be beneficial to the development of HDD in the future.