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▲ [14p-P10-43] Structural disorder and magnetism in equiatomic CoFeMnSi epitaxial thin films
Keywords:Spintronics, Heusler alloys
In this study, we investigate the structural and magnetic properties of CFMS films and also investigate tunnel magnetoresistance (TMR) for MTJs. Samples with CFMS annealed at Ta = 300, 400, 500 and 600ºC were prepared using the UHV magnetron sputtering system.
The XRD measurements confirm epitaxial growth for samples with Ta ≥ 400ºC. The analysis of XRD data (in-plane and out-of-plane) indicate that the CFMS films have the B2 and L21 long range orders that change with the post annealing. Saturation magnetization (MS) value increases with increase in Ta and it attains a value of 590 emu/cm3 for sample with Ta = 600ºC. TMR was observed with respect to the ex-situ annealing.
The XRD measurements confirm epitaxial growth for samples with Ta ≥ 400ºC. The analysis of XRD data (in-plane and out-of-plane) indicate that the CFMS films have the B2 and L21 long range orders that change with the post annealing. Saturation magnetization (MS) value increases with increase in Ta and it attains a value of 590 emu/cm3 for sample with Ta = 600ºC. TMR was observed with respect to the ex-situ annealing.