The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

CS Code-sharing session » CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[15a-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

Wed. Mar 15, 2017 9:00 AM - 12:00 PM 318 (318)

Takeshi Higashiguchi(Utsunomiya Univ.), Takeo Ejima(Tohoku Univ.)

10:45 AM - 11:00 AM

[15a-318-7] Coherent X-ray Diffraction Imaging at SPring-8 Hyogo Beamline BL24XU

Yuki Takayama1,2, Yuki Takami1, Takamasa Miyagawa1, Yasushi Kagoshima1 (1.Univ. Hyogo, 2.RIKEN RSC)

Keywords:coherent X-ray diffraction imaging, nanoimaging, X-ray microscopy

The SPring-8 Hyogo beamline BL24XU, dedicated to industrial applications, has provided various X-ray imaging techniques based on a normal CT and both imaging and scanning microscopes with zone-plate optics for seamless analysis of spatially hierarchical structures from millimeters to submicrometer size scales. To extend imaging targets to samples with nanostructures, we are developping a coherent diffraction imaging (CDI) system. Here we report current status of the CDI system constructed in BL24XU.
Our CDI system is a plane-wave illumination type with a pinhole-slit optics and designed for experiments at photon energies of 8 - 10 keV. This relatively high energy X-rays allow experiments under atomospheric condition, which is advantageous for visualization of samples in native states. A spatially isolated sample particle is placed at ~ 1.5 m downstream of the pinhole and irradiated by X-rays with a photon flux density of ~ 1.0×1010 photons/16 μmφ (FWHM)/sec. A pair of Si apertures just before the sample blocks parasitic scatterings from upstream optics. Then a diffraction pattern with spatial frequencies of up to ~ 66 - 82 μm-1 from the sample is recorded on a Pilatus2 placed at ~ 4.1 m downstream of the sample. In this presentation, we also show some recent applications including visualization of internal structures of a colloidal gold cluster at a full period resolution of 29.1 nm.