[15p-302-1~7] Perspectives on In-situ Observations during the Preparation of Organic Thin Film Devices

[15p-302-3] Infrared Spectral Changes during the Formation of Organic Thin Films

〇Masato Yamamoto¹ (1.Showa Univ.)

Keywords:infrared external reflection spectroscopy, monolayer, molecular orientaiton

Infrared reflection spectroscopy can be applied to examine the molecular structure of monolayer at surface. To investigate film formation processes, an external reflection method is applicable, since it does not require physical contact of the prism with the sample surface. Here, we report on infrared spectroscopy of organic films on metal, semiconductors, and at interfaces between air and liquid. Two examples are infrared reflection absorption spectroscopy of long-chain n-alkane (n-C₄₄H₉₀) structures on a Au(111) surface, and infrared external reflection spectroscopy of the molecular structures of n-heptadecane at free surfaces.