The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

CS Code-sharing session » CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[15p-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

Wed. Mar 15, 2017 1:15 PM - 4:15 PM 318 (318)

Takeshi Higashiguchi(Utsunomiya Univ.)

1:15 PM - 1:30 PM

[15p-318-1] Total-electron-yield measurements of insulating organic films by soft X-ray irradiation

Yasuji Muramatsu1, Takahito Ouchi1 (1.Univ. Hyogo)

Keywords:synchrotron radiation, total electron yield, insulating film

It is generally hard to measure total-electron-yield (TEY) of insulating bulk samples by soft X-ray irradiation. However, we have recently found that TEY of insulating organic films put on conductive substrates can be easily measured through the conductive substrates. It has been confirmed that conductive path can be formed along the X-ray beam path. In this study, TEY measurements of PET films will be demonstrated.