2017年第64回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

9 応用物性 » 9.2 ナノワイヤ・ナノ粒子

[15p-421-1~18] 9.2 ナノワイヤ・ナノ粒子

2017年3月15日(水) 13:15 〜 18:15 421 (421)

原 真二郎(北大)、章 国強(NTT物性研)、柳田 剛(九大)

17:45 〜 18:00

[15p-421-17] Mapping Potential Distribution over Electrically Biased Networks of Conductive Nanowires

〇(M1)Abdul Karim1、Higuchi Rintaro2、Shingaya Yoshitaka2、Nakayama Tomonobu2 (1.University of Tsukuba、2.WPI-MANA, NIMS)

キーワード:Nanowires, Kelvin Probe Force Microscope, complex network

Recently, metal nanowire (NW) networks have extensively been studied as a form used for the transparent electrodes because of their high conductivity and flexibility.[1] Also, NW network is useful as a material for water-filtration system with antibacterial functions because NW produces higher electric field than other structure.[2] In the above applications, local conductance and potential distribution over the NW-network are important factors for their performance. It is, therefore, necessary to investigate electrical properties of complex networks for understanding the mechanism and improving the application performance. In this study, we finally aim at mapping the potential distribution of silver NW (AgNW) in complex networks using KPFM (Kelvin Probe Force Microscope). KPFM would be suitable technique to measure the local potential of AgNW network with high spatial resolution.[3]
AgNWs were synthesized by “polyol process”. Briefly, 1,2-propyleneglycol containing poly(vinylpyrrolidone) and NaCl was placed in a glass vial. After dropping AgNO3 solution, the glass vial was capped and heated at 130 ºC for 1 h. The AgNW network was prepared by drop-casting of alcohol dispersion on a substrate (Fig. 1). The surface of AgNW is covered with a thin insulating polymer layer. Thus the polymer layer creates a metal/insulator/metal (MIM) junction between nanowires bearing non-linear electrical properties such as resistive switching based on the electromigration of Ag atoms. In this presentation we discuss about potential distribution of AgNW network and the changes induced by applied bias voltage together with benefits and drawbacks of the KPFM measurements.

References:
[1] L. Andres et al, Nanotechnology, 26 (2015)
[2] D. Schoen et al, Nano Letter, 10 (2010)
[3] W. Melitz et al, Surface Sci., 66 (2011)