The 64th JSAP Spring Meeting, 2017

Presentation information

Poster presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[15p-P8-1~10] 15.7 Crystal evaluation, impurities and crystal defects

Wed. Mar 15, 2017 1:30 PM - 3:30 PM P8 (BP)

1:30 PM - 3:30 PM

[15p-P8-2] First principles calculation of combined impact of dopant and plane stress on formation of intrinsic point defects in single crystal silicon

kouji kobayashi1, shunta yamaoka1, koji sueoka1 (1.Okayama Pref Univ.)

Keywords:Single crystal Si, Point defect, Thermal stress