[16a-213-1~7] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[16a-213-5] X-ray diffraction measurement of amorphous Ge-S using synchrotron radiation - local structural changes by the variation of Ge composition

〇Yoshifumi Sakaguchi¹, Takayasu Hanashima¹, Ohara Koji², Maria Mitkova³ (1.CROSS, 2.JASRI, 3.BSU (U.S.A.))

Keywords:amorphous Ge-S, local order, X-ray diffraction

Interestingly, amorphous Ge-S is composed of several types of "building blocks" in the network and the predominant building block changes with increasing Ge coposition. In this presentation, we report on the result of the X-ray diffraction measurement using synchrotron radiation and discuss the local order in amorphous Ge-S system.