[16a-302-1~11] 12.4 Organic light-emitting devices and organic transistors

[16a-302-7] Estimation of Charge-Injection Barriers at the Metal/Pentacene Interface Through Accumulated Charge Measurement

〇(M1)Masato Otsuka¹, Tomofumi Kadoya¹, Akinari Ogino¹, Seiichi Sato¹, Tokuji Yokomatsu², Kazusuke Maenaka², Jun-ichi Yamada¹, Hiroyuki Tajima¹ (1.Univ. of Hyogo MS., 2.Univ. of Hyogo Eng.)

Keywords:Charge-Injection barrier, Organic semiconductor device, Pentacene

Charge injection from a metal electrode to an organic semiconductor is a key issue in organic electronics. Recently, we have reported a new method to determine the charge-injection barrier, namely accumulated charge measurement (ACM). ACM is a method of applying triangular-wave voltage to two-terminal capacitor consisting of metal/organic semiconductor/insulator/metal structure. Then, accumulated charge at the organic-semiconductor layer is estimated. This method is capable of performing measurement of the actual device structure. It is therefore noteworthy that obtained information about the metal/semiconductor interface includes all factors such as the interfacial dipole, carrier traps, and impurity effects. In this presentation, we report that the charge-injection barrier from several electrodes to pentacene by use of ACM.