[16a-311-1~11] 3.6 Ultrashort-pulse and high-intensity lasers

[16a-311-4] Imaging of photogenerated electron dynamics on semiconductor surfaces using femtosecond time-resolved photoemission electron microscopy

〇Keiki Fukumoto¹, Ken Onda², Shin-ya Koshihara² (1.KEK, 2.Titech)

Keywords:semiconductor, carrier dynamics, imaging

By the development of the system for time-resolved photoemission electron microscopy with a repetition rate- and energy-variable laser system, photogenerated electron dynamics on semiconductor surfaces was successfully observed with spatial, temporal, and spectral resolutions of 50 nm, 100 fs, and 40 meV, respectively, with suppression of sample charging.