9:00 AM - 9:15 AM
[16a-512-1] Novel techniques to visualize buried interfaces in multilayered thin films
Keywords:imaging, X-ray reflectivity, neutron reflectivity
Properties and fucntions of the muli-layered thin films strongly depend on the layered structures, particularly the interfaces. It is extremely important to develop analytical methods senstive to buried interfaces with good spatial resolution. The present talk discusses some advanced X-ray and neutron imaging methods which can discuss the diffrence of the strcuture in the specific position, which may connect to the interests on the properties and functions.