5:15 PM - 5:30 PM
[16p-211-15] Mechanism of potential-induced degradation for heterojunction c-Si PV modules
Keywords:photovoltaic module, potential-induced degradation, heterojunction
Potential-induced degradation (PID) for heterojunction crystalline silicon photovoltaic modules is characterized by a decrease in short-circuit current mainly originating from reduction in transparent conducting oxide. PID test for long duration also induces a decrease in open-circuit voltage.