PID test for c-Si photovoltaic modules under irradiation and high humidity

Yukiko Hara; Atsushi Masuda

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.3 Bulk, thin-film and other silicon-based solar cells

[16p-211-1~18] 16.3 Bulk, thin-film and other silicon-based solar cells

Thu. Mar 16, 2017 1:15 PM - 6:15 PM 211 (211)

Yasuaki Ishikawa(NAIST), Keisuke Ohdaira(JAIST)

5:45 PM - 6:00 PM

[16p-211-17] PID test for c-Si photovoltaic modules under irradiation and high humidity

〇Yukiko Hara¹, Atsushi Masuda¹ (1.AIST)

Keywords:PID, c-Si photovoltaic, irradiation

Potential-induced degradation (PID) test was carried out for crystalline Si photovoltaic modules under light irradiation and high humidity condition. It was found that PID is suppressed by light irradiation mainly with UV region even under high humidity condition.