[16p-512-1~10] Imaging of interfaces in thin films and multilayers

[16p-512-6] Automated structure analysis of perovskite oxide interfaces

〇Yusuke Wakabayashi¹ (1.Osaka Univ.)

Keywords:surface x-ray diffraction, metal oxide, structure analysis

Because of the variety of the electronic states of perovskite oxides, interfaces between them are really interesting. One can make atomically coherent interface between ferromagnetic, antiferromagnetic, metallic, insulating, or superconducting materials. We report on the current status of the interfacial structure analysis technique based on the surface x-ray diffraction technique.