The 64th JSAP Spring Meeting, 2017

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16p-E206-1~17] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Thu. Mar 16, 2017 1:45 PM - 6:30 PM E206 (E206)

Koichiro Saga(Sony), Nobuya Mori(Osaka Univ.), Takashi Hasunuma(Univ. of Tsukuba)

5:45 PM - 6:00 PM

[16p-E206-15] Prediction of Short Channel Effects in Negative Capacitance Transistors by Device Simulation

〇Junichi Hattori1, Koichi Fukuda1, Tsutomu Ikegami1, Hiroyuki Ota1, Shinji Migita1, Akira Toriumi2 (1.AIST, 2.Univ. of Tokyo)

Keywords:negative capacitance, ferroelectric, TCAD