The 64th JSAP Spring Meeting, 2017

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[16p-P4-1~8] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Thu. Mar 16, 2017 1:30 PM - 3:30 PM P4 (BP)

1:30 PM - 3:30 PM

[16p-P4-6] FM–AFM analysis of LTO/ ionic liquid interface during lithium ion insertion process

〇Yuya Takara1, Mitsunori Kitta2, Takashi Ichii1, Toru Utsunomiya1, Hiroyuki Sugimura1 (1.Kyoto Univ., 2.AIST)

Keywords:AFM, LTO, ionic liquid