The 64th JSAP Spring Meeting, 2017

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[16p-P4-1~8] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Thu. Mar 16, 2017 1:30 PM - 3:30 PM P4 (BP)

1:30 PM - 3:30 PM

[16p-P4-8] Investigation of energy dissipation detected with non-contact atomic force microscopy

〇Ryo Inamura1, Mikihiro fujii1, Masahiko tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)

Keywords:nc-AFM, energy dissipation, Si(111)-7x7