The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[17a-418-1~10] 3.8 Optical measurement, instrumentation, and sensor

Fri. Mar 17, 2017 9:00 AM - 11:45 AM 418 (418)

Ryuji Morita(Hokkaido Univ.), Shinichi Watanabe(Keio Univ.)

11:00 AM - 11:15 AM

[17a-418-8] Precise profilometry for scattered media and tomography for multiple-layers samples using the Discrete frequency scanning laser

〇(D)Tuan Cong Truong1, Tuan Quoc Banh1,2, Tatsutoshi Shioda1 (1.Saitama University, 2.Sevensix Inc.)

Keywords:discrete frequency scanning laser, tomography

We propose the novel discrete frequency scanning laser of 200 GHz scanning step for industrial profilometry and tomography. The laser ring cavity of the proposed light source consists of a lasing medium, a frequency tuning part, and the Fabry-Perot etalon as a frequency comb generator. The proposed light source is used in the precise profilometry and tomography for the scattered media and multiple-layers samples, respectively.