Thu. Sep 20, 2018 9:30 AM - 9:45 AM [20a-331-3] Evaluation of low concentration Carbon in GaN by SIMS 〇Kazue Shingu1, Masumi Obuchi1, Richard Hockett2, Larry Wang2 (1.Nano Science, 2.EAG) PDF Download
Wed. Sep 19, 2018 4:30 PM - 4:45 PM [19p-131-11] Measurement of low level carbon in silicon substrate using SIMS 〇Masumi Obuchi1, Kazue Shingu1, Larry Wang2, Peter Zhao2, Man Xu2, Jing Guo2, Hang Dong Lee2,1 (1.NANO SCIENCE, 2.EAG) PDF Download
Wed. Sep 19, 2018 5:00 PM - 5:15 PM [19p-CE-11] Evaluation of Mg-implanted GaN by cathode luminescence 〇Susumu Saitoh1, Takahasi Kazuteru1, Salmon Michael E.2, Shingu Kazue1 (1.Nano Science Corp., 2.EAG Inc.) PDF Download