Johji Nishio

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Speaker, Author, Co-Author

Fri. Sep 21, 2018 9:00 AM - 12:30 PM 141 (141+142)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[21a-141-1~13] 15.6 Group IV Compound Semiconductors (SiC)

9:15 AM - 9:30 AM

[21a-141-2] Partial Dislocation Analysis by Photoluminescence Imaging and Spectroscopy in 4H-SiC Epitaxial Layers

〇Johji Nishio¹, Mitsuhiro Kushibe¹, Aoi Okada¹, Chiharu Ota¹ (1.Toshiba Corp.)