Takeshi Uruma

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Speaker, Author, Co-Author

Tue. Sep 18, 2018 9:30 AM - 11:45 AM 143 (143)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[18a-143-1~9] 6.6 Probe Microscopy

11:15 AM - 11:30 AM

[18a-143-8] Measurement of carrier density distribution by dissipative force modulation scanning capacitance force microscopy

〇(DC)Takeshi Uruma¹, Nobuo Satoh², Hidekazu Yamamoto², Futoshi Iwata¹ (1.Graduate School of Sci. and Tech., Shizuoka Univ., 2.Chiba. Ins. of Tech.)