Ryo Yokogawa

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Speaker, Author, Co-Author

Tue. Sep 18, 2018 1:15 PM - 5:00 PM 235 (3Ｆ_Lounge２)

Oral presentation
| 15 Crystal Engineering
| 15.5 Group IV crystals and alloys

[18p-235-1~14] 15.5 Group IV crystals and alloys

4:30 PM - 4:45 PM

[18p-235-13] Determination of Ge Fraction using Broad Peaks in Raman spectra of SiGe with High Fraction using Oil-Immersion Raman Spectroscopy

〇Ryo Yokogawa^1,2, Masato Koharada¹, Kazutoshi Yoshioka¹, Seiya Ishihara^1,2, Koji Usuda³, Atsushi Ogura¹ (1.Meiji Univ., 2.JSPS Research Fellow DC, 3.Toshiba Memory Corp.)

Thu. Sep 20, 2018 9:00 AM - 11:45 AM 234B (234-2)

Oral presentation
| 22 Joint Session M
| 22.1 Joint Session M "Phonon Engineering"

[20a-234B-1~10] 22.1 Joint Session M "Phonon Engineering"

11:30 AM - 11:45 AM

△ [20a-234B-10] Evaluation of Thermal Properties in SOI Film Covered with Oxide Film by Raman Spectroscopy

〇Ryo Yokogawa^1,2, Motohiro Tomita^1,3, Takanobu Watanabe³, Atsushi Ogura¹ (1.Meiji Univ., 2.JSPS Research Fellow DC, 3.Waseda Univ.)

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