The 79th JSAP Autumn Meeting, 2018

Exhibitors' information

[Aa-3] Semilab Japan K.K.

Non-Contact CV measurement equipment FAaST, Film thickness measurement equipment Spectroscopy Ellipsometer SE-2000, Career Mobility measurement equipment LE-1600

  • Address

    222-0033
    神奈川県横浜市港北区新横浜2-15-10　YS新横浜ビル6階

  • Tel

    045-620-7960

  • Web site, SNS

    http://www.semilab-j.jp/