[Bt-10] Samco Inc.

-

[Av-6] SANKEI CO., LTD.

■加熱・冷却型小型プローバ VPH-4-S / NA-12

[Bt-1] SANYU ELECTRON CO., LTD.

-

[As-2] SCHRÖDINGER

-

[B-4] Scienta Omicron, Inc.

HAXPES-Lab, SPM, HiPP, J-105, LEED

[Be-7] SDI Company Ltd.

[Bt-9] SEIKO EG&G CO., LTD.

Lock-in Amplifier 7230 7124, Light Chopper 197

[Aa-3] Semilab Japan K.K.

Non-Contact CV measurement equipment FAaST, Film thickness measurement equipment Spectroscopy Ellipsometer SE-2000, Career Mobility measurement equipment LE-1600

[Aop-17] sevensix Inc.

[Bm-5] Sigma-Aldrich Japan G.K.

-

[A-10] SIJTechnology, Inc.

Super Inkjet Technology for ultrafine femtoliter to picoliter droplet patterning. -Super Inkjet Printer: Droplet volume: 0.1 fL(femtoliter)- 10pL(picoliter), Line width: 0.6 micrometre - several te...

[Aop-20] Spectra Co-op

Compact NIR spectrum Sensor "NIR Meter"

[B-2] SPLEAD Corporation

■ALD装置 ■スパッタ装置 ■CVD装置 ■リチウム蒸着装置 ■UHVゲートバルブ ■HVアングルバルブ ■真空コンポーネント

[Av-4] SPP Technologies Co., Ltd.

[Ab-1] Springer Nature

Nature Research Journals such as Nature Electronics, Nature Reviews Physics, etc, Springer Nature eBooks, Display Springer’s print books with 20% disc., Demonstration of SpringerMaterials and...

[Ba-6] STR Japan K.K.

Computer modeling for Crystal growth and Devices

[Ab-5] STRATEGIC Corporation

-

[Aop-22] SYNERGY OPTOSYSTEMS

Optical beam profile measurement system

[Aop-12] SYSTEMHOUSE SUNRISE Inc.

1.I-V measurement system of perovskite solar cells. 2.Quantum efficiency measurement of perovskite solar cells. 3.C-V and C-F measurement of solar cells.

Exhibitors