[18a-143-1~9] 6.6 Probe Microscopy

Tue. Sep 18, 2018 9:30 AM - 11:45 AM 143 (143)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:30 AM - 9:45 AM

[18a-143-1] Single cancer cell diagnosis with morphological and rheological parameters measured by atomic force microscopy

〇(D)Ryosuke Tanaka¹, Moe Nagase¹, Kaori Kuribayashi-Shigetomi¹, Agus Subagyo¹, Kazuhisa Sueoka¹, Takaharu Okajima¹ (1.Info. Sci. & Tech. Hokkaido Univ.)

9:45 AM - 10:00 AM

[18a-143-2] Feedback Control for Tapping Mode Scanning Probe Electrospray Ionization

〇Yoichi Otsuka¹, Bui Kamihoriuchi¹, Aya Takeuchi¹, Futoshi Iwata², Takuya Matsumoto¹ (1.Osaka Univ., 2.Shizuoka Univ.)

10:00 AM - 10:15 AM

[18a-143-3] High speed AFM observation of lipid degradation process on photocatalytic TiO₂ surface

〇Hayato Yamashita^1,2, Daiki Katsube¹, Masayuki Abe¹ (1.Grad. Sch. of Eng. Sci., Osaka Univ., 2.PRESTO,JST)

10:15 AM - 10:30 AM

[18a-143-4] Visualization of biotinylated DNA on streptavidin crystal using FM-AFM

〇Shogo Maeda¹, Hiroaki Kominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

10:30 AM - 10:45 AM

[18a-143-5] Development of a fine material deposition technique using a scanning nanopipette probe microscope capable of irradiating localized atmospheric pressure plasma jet

〇Sho Yamamoto¹, Daisuke Morimatsu¹, Masaru Shimomura¹, Akihisa Ogino¹, Masaaki Nagatsu², Futoshi Iwata^1,2 (1.Graduate school of Engineering, Shizuoka Univ., 2.Research Institute of Electronics, Shizuoka Univ.)

10:45 AM - 11:00 AM

[18a-143-6] Fabrication of a micropillar based on deposition of Au colloidal nanoparticles using a scanning ion conductance microscope

〇Masayoshi Yoshioka¹, Futoshi Iwata^1,2 (1.Shizuoka Univ., 2.Research Institute of Electronics)

11:00 AM - 11:15 AM

[18a-143-7] Depth profiling of polystyrene nanoparticles buried in polymer matrix by scanning thermal noise microscopy

〇Hiroshi Tono¹, Kuniko Kimura¹, Kei Kobayashi¹, Hirohumi Yamada¹ (1.Kyoto Univ.)

11:15 AM - 11:30 AM

[18a-143-8] Measurement of carrier density distribution by dissipative force modulation scanning capacitance force microscopy

〇(DC)Takeshi Uruma¹, Nobuo Satoh², Hidekazu Yamamoto², Futoshi Iwata¹ (1.Graduate School of Sci. and Tech., Shizuoka Univ., 2.Chiba. Ins. of Tech.)

11:30 AM - 11:45 AM

[18a-143-9] Investigation of carrier dynamics in organic thin-film transistors by time-resolved Kelvin-probe force microscopy without voltage modulation (2)

〇Kouichi Innami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Session information