[19a-143-1~8] 6.6 Probe Microscopy

Wed. Sep 19, 2018 9:30 AM - 11:45 AM 143 (143)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

9:30 AM - 10:00 AM

[19a-143-1] [JSAP Best Review Paper Award Speech] High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy

〇Yasuo Cho¹ (1.Tohoku Univ.)

10:00 AM - 10:15 AM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

10:15 AM - 10:30 AM

〇Yasuhiro Senda¹ (1.Yamaguchi Univ.)

10:30 AM - 10:45 AM

〇(DC)Masahide Sugayama¹ (1.Graduate School of IST, Hokkaido Univ)

10:45 AM - 11:00 AM

〇Akitoshi Shiotari¹, Yuichiro Shiozawa², Yoshiaki Sugimoto¹, Jun Yoshinobu² (1.GSFS, Univ. of Tokyo, 2.ISSP, Univ. of Tokyo)

11:00 AM - 11:15 AM

〇Tatsuya Yamamoto¹, Ryo Izumi¹, Katsuharu Matsumoto¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹, Kazushi Miki² (1.Osaka Univ., 2.Hyogo Univ.)

11:15 AM - 11:30 AM

〇Daiki Kura¹, Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa Univ., 2.JAIST)

11:30 AM - 11:45 AM

〇Haruka Mitera¹, Taku Murakami¹, Ryota Hashimoto¹, Keisuke Ishizuka², Yoshihumi Oshima², Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa univ., 2.JAIST)