In-plane Hole Diffusion Observed by Time Domain Reflectometry

Masatoshi Sakai; Takuto Honda; Hiroaki Murakami; Yugo Okada; Hiroshi Yamauchi; Yuichi Sadamitsu; Yuta Hashimoto; Nozomi Onodera; Kazuhiro Kudo

Presentation information

Oral presentation

12 Organic Molecules and Bioelectronics » 12.4 Organic light-emitting devices and organic transistors

[18a-145-1~10] 12.4 Organic light-emitting devices and organic transistors

Tue. Sep 18, 2018 9:00 AM - 11:45 AM 145 (Reception Hall)

Masatoshi Sakai(Chiba University), Hiroyuki Okada(Univ. Toyama)

9:30 AM - 9:45 AM

[18a-145-3] In-plane Hole Diffusion Observed by Time Domain Reflectometry

〇Masatoshi Sakai¹, Takuto Honda¹, Hiroaki Murakami¹, Yugo Okada², Hiroshi Yamauchi¹, Yuichi Sadamitsu³, Yuta Hashimoto³, Nozomi Onodera³, Kazuhiro Kudo¹ (1.Chiba Univ., 2.Center for Frontier Science, Chiba Univ., 3.Nippon Kayaku)

Keywords:organic semiconductor, thin film transistor, carrier injection

Carrier injection of OTFT attract strong attention in this field. We proposed time domain refrectometry to observe the carrier injection process in time domain. We will discuss the hole diffusion in the channel region of the pentacene TFT during the cariier injection and carrier exhaust.