[18p-143-1~15] 6.6 Probe Microscopy

△ [18p-143-4] Simulation of Force Spectroscopy of Atomic-Scale Peeling of Graphene

〇Ryoji Okamoto¹, Naruo Sasaki¹ (1.The Univ. of Electro-Commun.)

Keywords:nanotribology, atomic force microscopy, graphene

Atomic-scale peeling of graphene has been investigated by using both molecular mechanics simulation and atomic force microscopy (AFM) measurement. However, the simulated results could not be directly compared with the measured data, because the effect of AFM was not included and the simulated graphene sheet was much smaller than the measured one. In this study, the peeling of graphene was modeled focusing on the adhesive characteristics of peeling process, and then the change of the force spectroscopy of the peeling characteristics with increasing the size of graphene sheet is discussed.